We've updated our Privacy Policy to make it clearer how we use your personal data.

We use cookies to provide you with a better experience. You can read our Cookie Policy here.

Advertisement

Handheld FTIR Measurement of Surface Contamination Session 2

Handheld FTIR Measurement of Surface Contamination Session 2 content piece image

Surface contamination can be a major problem within many industries. It has been shown to lead to component failures, production issues, final product defects and often expensive warranty claims.

In this webinar, we will aim to describe how, with its wide variety of sample interfaces, the Agilent 4300 handheld Fourier transform infrared (FTIR) spectrometer has been utilized within industry to both identify surface contamination type and quantify the sample contamination present depending on the contamination challenge.

Attend this webinar to learn:

  • Handheld FTIR spectroscopy basics, advantages and applications.
  • How a variety of FTIR sample interfaces interact with sample and substrate to produce quality spectral information.
  • How spectral information can be used to identify surface contamination.
  • Mathematical tactics for quantification of surface contamination on different substrates.
Speakers
Donald Inglis
Donald Inglis
Product Specialist, Mobile and Handheld FTIR, Agilent Technologies
Pik Leung Tang PhD
Pik Leung Tang PhD
Application Specialist, Agilent Technologies